Email：market@millennialsolar.com
Email：market@millennialsolar.comBasic Characterization of Solar Cell
In-Line Four Point Probe Tester
Amorphous/microcrystalline Silicon Materials
Steady State Solar Simulator for Solar Cell
Potential Induced Degradation Test
Reverse Current Overload Tester
Potential Induced Degradation (PID) Tester
Current Continuity Test System
Environment Induced Decay Aging Test
The MNPVQE-300 Photovoltaic QE System is a common tool in photovoltaic research and production line quality processes for accurate determination of solar cell spectral response/EQE (IPCE) and IQE.
The MNPVQE-300 is compatible with a wide range of photovoltaic device types, materials, and architectures, including c:Si, mc:Si, a:Si, µ:Si, CdTe, CIGS, CIS, Ge, dye-sensitized, organic/polymer, tandem, multi-junction (2-, 3-, 4-junction, etc.), quantum well, quantum dot, chalcogenide, and perovskite.
EQE/IQE Test of Photovoltaic Devices
External quantum efficiency (EQE)/internal photon conversion efficiency (IPCE), defined as the number of electrons provided to the external circuit for each photon incident on the device, can be directly obtained from the spectral response.
•Measurement of the total reflectivity (diffuse and specular) and total transmittance (diffuse and normal) of the device with the aid of an integrating sphere
•The measured spectral response can be used to predict the expected device short-circuit current density J sc under AM1.5 standard test conditions
•Photovoltaic device IV measurements, used to determine device J sc and I sc , should be performed under AM1.5 lighting
Measurement of Four-Junction Photovoltaic Cells
As photovoltaic technology develops, the capabilities of MNPVQE-300 are also developing. Here we introduce the measurement of spectral response/EQE and IQE of multi-junction solar cells.
•Multi-junction photovoltaic cells are epitaxially grown on a substrate and interconnected by tunnel diodes
•Proper measurement of multi-junction PV devices requires the use of optimized optical biasing for all junctions and voltage biasing for the bottom junction
•After determining the spectral response of all component junctions, the EQE can be calculated directly, and the IQE can be calculated by adding a reflectance measurement using the DTR6 integrating sphere accessory.
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Provide customers with comprehensive support from product to production line operation through on-site operation guidance and after-sales technical support.
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