Basic Characterization of Solar Cell
In-Line Four Point Probe Tester
Amorphous/microcrystalline Silicon Materials
Steady State Solar Simulator for Solar Cell
Potential Induced Degradation Test
Reverse Current Overload Tester
Potential Induced Degradation (PID) Tester
Current Continuity Test System
Environment Induced Decay Aging Test
Item | Content |
---|---|
Line width repeatability measurement accuracy | 0.3μm |
PT repeatability measurement accuracy | 2μm |
Film thickness repeatability measurement accuracy | 0.3μm |
Tension repeatability accuracy | 0.5N/cm |
Defect judgment size | ≥2μm (customizable) |
PT, line width, film thickness measurement display resolution | 0.1μm |
Tension display resolution | 0.1N/cm |
Screen inspection specifications | ≤220*220mm(Screen size can be customized) |
Screen testing time | ≤8min |
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